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| A company is seeking Techniques for small-defect metrology using a known artifact to calibrate the measuring equipment.
Desired outcome: you provide a calibration technique so that an artifact possessing a known dimensional feature or defect that is representative of a feature that could be seen in an item-under-test can be used to calibrate the machine that measures the defects. The difference between a known artifact and the answer produced by the equipment used to measure it will allow calculation of the 'uncertainty' of measurement for that measuring equipment. The artifact must meet NIST standards.
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